au.\*:("ERLEWEIN J")
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A MODEL CALCULATION OF THE INFLUENCE OF SURFACE TRANSPORT ON THE DEPTH RESOLUTION IN SPUTTER PROFILINGERLEWEIN J; HOFMANN S.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 69; NO 3; PP. L39-L42; BIBL. 16 REF.Article
ANWENDUNG DER QUANTITATIVEN AUGERELEKTRONENSPEKTROSKOPIE (AES) AUF DUENNE OBERFLAECHENSCHICHTEN = APPLICATION DE LA SPECTROSCOPIE AUGER QUANTITATIVE EN ANALYSE DE COUCHES MINCES SUPERFICIELLESHOFMANN S; ERLEWEIN J.1979; MICROCHIM. ACTA; AUT; DA. 1979; VOL. 1; NO 1-2; PP. 65-74; ABS. ENG; BIBL. 16 REF.Article
A MODEL OF THE KINETICS AND EQUILIBRIA OF SURFACE SEGREGATION IN THE MONOLAYER REGIMEHOFMANN S; ERLEWEIN J.1978; SURF. SCI.; NLD; DA. 1978; VOL. 77; NO 3; PP. 591-602; BIBL. 23 REF.Article
DEPTH RESOLUTION AND SURFACE ROUGHNESS EFFECTS IN SPUTTER PROFILING OF NICR MULTILAYER SANDWICH SAMPLES USING AUGER ELECTRON SPECTROSCOPY.HOFMANN S; ERLEWEIN J; ZALAR A et al.1977; THIN SOLID FILMS; NETHERL.; DA. 1977; VOL. 43; NO 3; PP. 275-283; BIBL. 21 REF.Article